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ground and lapped for highest degree of flatness
such as pulling to a load or maintaining a load for a specified period of time
Special features: Fine Graduation
This is a lightweight
Item number: 172-404
378-186-1 FS70L Finescope Unit FS70 for Laser app. 1064/532/355 nm CAL10 B2 ground and lapped for highestExcellent operability with the optional inward rotating turret and high quality objective lenses with long working distance. Ideal as the microscope unit of a prober station for semiconductors. The L and L4 models support YAG laser wavelength ranges from 266 up to 1064 nm allowing laser cutting of thin films and liquid crystal substrates. Ergonomic design with combined knob for coarse and enlarged fine focus adjustment. Features Focus adjustment:
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