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Variety of standardized stages in sizes up to 400 × 200 mm
such as tubing thickness
Metric Digimatic Micrometer 0-25mm 293-821-30 W/O Data Output
Max Depth: 77mm
Blade Type B
378-184-1 FS70 Finescope Unit FS70 Caliper Gauge Variety of standardized stages inExcellent operability with the optional inward rotating turret and high quality objective lenses with long working distance. Ideal as the microscope unit of a prober station for semiconductors. The L and L4 models support YAG laser wavelength ranges from 266 up to 1064 nm allowing laser cutting of thin films and liquid crystal substrates. Ergonomic design with combined knob for coarse and enlarged fine focus adjustment. Features Model short base: FS70
