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Bowers Time 5100 Portable LEEB Hardness Tester - DL Probe CAL56 B1 Mitutoyo 101-120 Ratchet Thimble Micrometer

SKU 89647260994
4.7
USD1288.67 USD1338.67

Pay in 4 interest-free payments of $322.17 Learn more

Shipping Estimate
USA
  • USA
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Ships within 48 hours · Estimated delivery Aug 14 - Aug 19

Description

Mitutoyo 101-120 Ratchet Thimble Micrometer

Travel stops kit (TSB003)

and general lifting or tension / compression requirements

Choose between a lever (ES10) for quick-action testing or a hand wheel (ES20) for more precise testing with greater consistency in testing results

Sample break detection with auto functions

Bowers Time 5100 Portable LEEB Hardness Tester - DL Probe CAL56 B1 Mitutoyo 101-120 Ratchet Thimble MicrometerTIME 5100 Portable LEEB Hardness Tester DL Probe Leeb hardness testing was invented in 1975 in Switzerland and has become one of the most popular portable testing methods currently available. The TIME Leeb Hardness testers are supplied to the industry since 1991 and can be seen as the current global standard for Portable hardness testing. View Product Data Sheet FEATURES Excellent portability for testing anywhere, anytime. Automatic gravity

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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